Testing big chips becomes an internal affair.

With the advent of the so-called system on a chip, or superchip, telling whether a complex integrated circuit is free of manufacturing flaws has become more difficult than ever before. Few believe that any automatic test equipment (ATE) machine of known architecture will be able to test tomorrow...

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Chi tiết về thư mục

Xuất bản năm:	IEEE spectrum 36, 4 (1999).
Tác giả chính:	Runyon, S.
Định dạng:	Bài viết
Ngôn ngữ:	Tiếng Anh
Những chủ đề:	Automatic test equipment. Automatic test pattern generation. Built-in self test. Design for testability. Integrated circuit testing. Internal scan design. Superchip. System-on-a-chip.