Improving the manufacturability of electronic designs.

The application of statistical circuit design techniques can prevent problems of low yield in manufacture of circuits. Statistical circuit design techniques analyze the yields of circuit designs whose underlying components exhibit random fluctuations. These techniques can help produce more robust de...

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Опубликовано в::	IEEE spectrum 36, 6 (1999).
Главный автор:	Stoneking, D.
Формат:	Статья
Язык:	English
Предметы:	Gaussian process. Arbitrary stochastic process. Circuit manufacture. Electronic designs manufacturability. Nonparametric boundary analysis. Random fluctuations. Robust designs. Statistical circuit design techniques. Statistical variations. Yield analysis.