Improving the manufacturability of electronic designs.

The application of statistical circuit design techniques can prevent problems of low yield in manufacture of circuits. Statistical circuit design techniques analyze the yields of circuit designs whose underlying components exhibit random fluctuations. These techniques can help produce more robust de...

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發表在:	IEEE spectrum 36, 6 (1999).
主要作者:	Stoneking, D.
格式:	Article
語言:	English
主題:	Gaussian process. Arbitrary stochastic process. Circuit manufacture. Electronic designs manufacturability. Nonparametric boundary analysis. Random fluctuations. Robust designs. Statistical circuit design techniques. Statistical variations. Yield analysis.