Test and measurement [Technology 2000 analysis and forecast].
The awareness that every electronic product, from PCs to Internet appliances, is pining for tinier and more powerful chips is whipping semiconductor development along at a frenetic pace. It is also hounding automation of design and test and IC test development, but test inevitably lags behind chip d...
| Published in: | IEEE spectrum 37, 1 (2000). |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Subjects: |