Physical random number generator based on MOS structure after soft breakdown.

Physical random number generator based on MOS structure after soft breakdown.

We present a novel physical random number generator (RNG) that uses a metal-oxide semiconductor (MOS) capacitor after soft breakdown (SBD) as a random source. It is known that the electrical properties of MOS capacitors after SBD show large fluctuation. When the resistor in an astable multivibrator...

Cur síos iomlán

Sonraí bibleagrafaíochta
Foilsithe in:IEEE Journal of solid state circuits 39, 8 (2004).
Príomhchruthaitheoir: Yasuda, S.
Formáid: Alt
Teanga:English
Ábhair:
1-bit counter.
MOS capacitor.
MOS capacitors.
MOS structure.
SBD.
Astable multivibrator.
Flip-flop.
Metal-oxide semiconductor.
Noise.
Physical random number generator.
Soft breakdown.