Physical random number generator based on MOS structure after soft breakdown.

We present a novel physical random number generator (RNG) that uses a metal-oxide semiconductor (MOS) capacitor after soft breakdown (SBD) as a random source. It is known that the electrical properties of MOS capacitors after SBD show large fluctuation. When the resistor in an astable multivibrator...

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Detalhes bibliográficos

Publicado no:	IEEE Journal of solid state circuits 39, 8 (2004).
Autor principal:	Yasuda, S.
Formato:	Artigo
Idioma:	inglês
Assuntos:	1-bit counter. MOS capacitor. MOS capacitors. MOS structure. SBD. Astable multivibrator. Flip-flop. Metal-oxide semiconductor. Noise. Physical random number generator. Soft breakdown.