Power optimized partial scan BIST implementation on DLX microprocessor

The need for efficient chip testing methods is needed as integrated circuits become more complex. Together with this is the increase in costs in terms of time and monetary resources with the use of external Automated Test Equipment (ATEs). One alternative is the incorporation of a Built-in Self-test...

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Bibliographic Details

Main Author:	Buenaventura, Arvi D.
Other Authors:	Miranda, Carlos Miguel A., Salvacion, Ma. Katrina D.
Format:	Thesis
Language:	English
Published:	2010
Subjects:	Microprocessors. Automatic test equipment. DLX microprocessor.