Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

书目详细资料
其他作者: Gupta, D. C. (Dinesh C.), Bacher, Fred R. 1955-, Hughes, William M. 1948-
格式: 图书
语言:English
出版: West Conshohocken, PA ASTM c1998.
主题:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.