Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Detaylı Bibliyografya
Diğer Yazarlar: Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
Materyal Türü: Kitap
Dil:English
Baskı/Yayın Bilgisi: West Conshohocken, PA ASTM c1998.
Konular:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.