Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Bibliografske podrobnosti
Drugi avtorji: Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
Format: Knjiga
Jezik:English
Izdano: West Conshohocken, PA ASTM c1998.
Teme:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.