Recombination lifetime measurements in silicon

Detalhes bibliográficos
Outros Autores:	Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
Formato:	Livro
Idioma:	English
Publicado em:	West Conshohocken, PA ASTM c1998.
Assuntos:	Semiconductors > Testing > Congresses. Service life (Engineering) > Forecasting > Congresses. Electronic measurements > Congresses.