Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

書誌詳細
その他の著者: Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
フォーマット: 図書
言語:English
出版事項: West Conshohocken, PA ASTM c1998.
主題:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.