Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Bibliographische Detailangaben
Weitere Verfasser: Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
Format: Buch
Sprache:English
Veröffentlicht: West Conshohocken, PA ASTM c1998.
Schlagworte:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.