Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Podrobná bibliografie
Další autoři: Gupta, D. C. (Dinesh C.), Bacher, Fred R. 1955-, Hughes, William M. 1948-
Médium: Kniha
Jazyk:English
Vydáno: West Conshohocken, PA ASTM c1998.
Témata:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.