Recombination lifetime measurements in silicon

書目詳細資料
其他作者:	Gupta, D. C. (Dinesh C.), Bacher, Fred R. 1955-, Hughes, William M. 1948-
格式:	圖書
語言:	English
出版:	West Conshohocken, PA ASTM c1998.
主題:	Semiconductors > Testing > Congresses. Service life (Engineering) > Forecasting > Congresses. Electronic measurements > Congresses.