VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

ग्रंथसूची विवरण
अन्य लेखक: Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing
स्वरूप: पुस्तक
भाषा:English
प्रकाशित: Amsterdam Elsevier Morgan Kaufmann c2006.
विषय:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Large scale integration > Design.