VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Bibliographic Details
Other Authors: Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing
Format: Book
Language:English
Published: Amsterdam Elsevier Morgan Kaufmann c2006.
Subjects:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Large scale integration > Design.