VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Bibliographische Detailangaben
Weitere Verfasser: Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing
Format: Buch
Sprache:English
Veröffentlicht: Amsterdam Elsevier Morgan Kaufmann c2006.
Schlagworte:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Large scale integration > Design.