Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

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Opis bibliograficzny
1. autor: Bushnell, Michael L. (Michael Lee) 1950-
Kolejni autorzy: Agrawal, Vishwani D. 1943-
Format: Książka
Język:English
Wydane: New York, N.Y. Springer c2000.
Hasła przedmiotowe:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Dostęp online:Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access