$Understanding the effect of surface flaws on fracture of silicon die$
QR kȏd

Understanding the effect of surface flaws on fracture of silicon die

Bibliografski detalji
Glavni autor:	Punzalan, Jaime C.
Format:	Disertacija
Jezik:	English
Izdano:	2003.
Teme:	Fracture mechanics. Fractography. Materials > Cracking > Measurement. Semiconductor wafers. Silicon crystals.