$Understanding the effect of surface flaws on fracture of silicon die$
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Understanding the effect of surface flaws on fracture of silicon die

Bibliografische gegevens
Hoofdauteur:	Punzalan, Jaime C.
Formaat:	Thesis
Taal:	English
Gepubliceerd in:	2003.
Onderwerpen:	Fracture mechanics. Fractography. Materials > Cracking > Measurement. Semiconductor wafers. Silicon crystals.