The Test access port and boundary scan architecture

The Test access port and boundary scan architecture

ग्रंथसूची विवरण
स्वरूप: पुस्तक
भाषा:English
प्रकाशित: Los Alamitos, Calif. IEEE Computer Society Press c1990.
विषय:
Boundary scan testing.
Computer architecture.
Electronic circuits > Testing > Data processing.