Diagnostic measurements in LSI/VLSI integrated circuits production

Diagnostic measurements in LSI/VLSI integrated circuits production

Podrobná bibliografie
Hlavní autor: Jakubowski, Andrzej
Další autoři: Marciniak, Wieslaw, Przewlocki, Henryk M.
Médium: Kniha
Jazyk:English
Vydáno: Singapore World Scientific 1991.
Témata:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.