Diagnostic measurements in LSI/VLSI integrated circuits production

Diagnostic measurements in LSI/VLSI integrated circuits production

书目详细资料
主要作者: Jakubowski, Andrzej
其他作者: Marciniak, Wieslaw, Przewlocki, Henryk M.
格式: 图书
语言:English
出版: Singapore World Scientific 1991.
主题:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.