Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Manylion Llyfryddiaeth
Awdur Corfforaethol: IEEE Computer Society. Test Technology Technical Committee
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Pynciau:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.