Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Detalles Bibliográficos
Autor Corporativo: IEEE Computer Society. Test Technology Technical Committee
Formato: Libro
Idioma:English
Publicado: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Subjects:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.