Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Bibliografske podrobnosti
Korporativna značnica: IEEE Computer Society. Test Technology Technical Committee
Format: Knjiga
Jezik:English
Izdano: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Teme:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.