Statistical approach to VLSI

Библиографические подробности
Другие авторы:	Director, Stephen W., Maly, W.
Формат:	‌
Язык:	английский
Опубликовано:	Amsterdam North-Holland 1994.
Серии:	Advances in CAD for VLSI v. 8
Предметы:	Integrated circuits > Very large scale integration > Defects. Integrated circuits > Very large scale integration > Design and construction > Statistical methods. Mathematical optimization.