कवर छवि

Manufacturing yield evaluation of VLSI/WSI systems

ग्रंथसूची विवरण
अन्य लेखक: Ciciani, Bruno
स्वरूप: पुस्तक
भाषा:अंग्रेज़ी
प्रकाशित: Los Alamitos, California IEEE Computer Society Press c1995.
विषय:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Wafer-scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Reliability.
Integrated circuits > Wafer-scale integration > Reliability.
Integrated circuits > Fault tolerance.