Manufacturing yield evaluation of VLSI/WSI systems

Bibliografische gegevens
Andere auteurs:	Ciciani, Bruno
Formaat:	Boek
Taal:	Engels
Gepubliceerd in:	Los Alamitos, California IEEE Computer Society Press c1995.
Onderwerpen:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.