Manufacturing yield evaluation of VLSI/WSI systems

التفاصيل البيبلوغرافية
مؤلفون آخرون:	Ciciani, Bruno
التنسيق:	كتاب
اللغة:	الإنجليزية
منشور في:	Los Alamitos, California IEEE Computer Society Press c1995.
الموضوعات:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.