Manufacturing yield evaluation of VLSI/WSI systems

Detalhes bibliográficos
Outros Autores:	Ciciani, Bruno
Formato:	Livro
Idioma:	English
Publicado em:	Los Alamitos, California IEEE Computer Society Press c1995.
Assuntos:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.