Manufacturing yield evaluation of VLSI/WSI systems

Manufacturing yield evaluation of VLSI/WSI systems

Bibliographic Details
Other Authors: Ciciani, Bruno
Format: Book
Language:English
Published: Los Alamitos, California IEEE Computer Society Press c1995.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Wafer-scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Reliability.
Integrated circuits > Wafer-scale integration > Reliability.
Integrated circuits > Fault tolerance.