Evaluation of advanced semiconductor materials by electron microscopy

Evaluation of advanced semiconductor materials by electron microscopy

Chi tiết về thư mục
Nhiều tác giả của công ty: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO)
Tác giả khác: Cherns, David
Định dạng: Sách
Ngôn ngữ:English
Được phát hành: New York Plenum Press c1989.
Những chủ đề:
Electron microscopy > Technique > Congresses.
Electrons > Diffraction > Congresses.
Semiconductors > Surfaces > Congresses.