NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO), & Cherns, D. (1989). Evaluation of advanced semiconductor materials by electron microscopy. Plenum Press.
Citace podle Chicago (17th ed.)NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO), a David Cherns. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. New York: Plenum Press, 1989.
Citace podle MLA (9th ed.)NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), et al. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Plenum Press, 1989.