VLSI testing digital and mixed analogue/digital techniques

Detaylı Bibliyografya
Yazar:	Hurst, Stanley L.
Materyal Türü:	Kitap
Dil:	English
Baskı/Yayın Bilgisi:	Herts, U.K. The Institution of Electrical Engineers c1998.
Konular:	Integrated circuits > Very large scale integration > Testing.
Online Erişim:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access