VLSI testing digital and mixed analogue/digital techniques

Библиографические подробности
Главный автор:	Hurst, Stanley L.
Формат:	‌
Язык:	English
Опубликовано:	Herts, U.K. The Institution of Electrical Engineers c1998.
Предметы:	Integrated circuits > Very large scale integration > Testing.
Online-ссылка:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access