VLSI testing digital and mixed analogue/digital techniques

VLSI testing digital and mixed analogue/digital techniques

Detalhes bibliográficos
Autor principal: Hurst, Stanley L.
Formato: Livro
Idioma:English
Publicado em: Herts, U.K. The Institution of Electrical Engineers c1998.
Assuntos:
Integrated circuits > Very large scale integration > Testing.
Acesso em linha:Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access