VLSI testing digital and mixed analogue/digital techniques

Bibliografische gegevens
Hoofdauteur:	Hurst, Stanley L.
Formaat:	Boek
Taal:	English
Gepubliceerd in:	Herts, U.K. The Institution of Electrical Engineers c1998.
Onderwerpen:	Integrated circuits > Very large scale integration > Testing.
Online toegang:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access