VLSI testing digital and mixed analogue/digital techniques

VLSI testing digital and mixed analogue/digital techniques

書誌詳細
第一著者: Hurst, Stanley L.
フォーマット: 図書
言語:English
出版事項: Herts, U.K. The Institution of Electrical Engineers c1998.
主題:
Integrated circuits > Very large scale integration > Testing.
オンライン･アクセス:Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access