VLSI testing digital and mixed analogue/digital techniques

Bibliografski detalji
Glavni autor:	Hurst, Stanley L.
Format:	Knjiga
Jezik:	English
Izdano:	Herts, U.K. The Institution of Electrical Engineers c1998.
Teme:	Integrated circuits > Very large scale integration > Testing.
Online pristup:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access