VLSI testing digital and mixed analogue/digital techniques

Bibliografiset tiedot
Päätekijä:	Hurst, Stanley L.
Aineistotyyppi:	Kirja
Kieli:	English
Julkaistu:	Herts, U.K. The Institution of Electrical Engineers c1998.
Aiheet:	Integrated circuits > Very large scale integration > Testing.
Linkit:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access