VLSI testing digital and mixed analogue/digital techniques

Bibliographische Detailangaben
1. Verfasser:	Hurst, Stanley L.
Format:	Buch
Sprache:	English
Veröffentlicht:	Herts, U.K. The Institution of Electrical Engineers c1998.
Schlagworte:	Integrated circuits > Very large scale integration > Testing.
Online Zugang:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access