VLSI testing digital and mixed analogue/digital techniques

VLSI testing digital and mixed analogue/digital techniques

Manylion Llyfryddiaeth
Prif Awdur: Hurst, Stanley L.
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Herts, U.K. The Institution of Electrical Engineers c1998.
Pynciau:
Integrated circuits > Very large scale integration > Testing.
Mynediad Ar-lein:Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access