VLSI testing digital and mixed analogue/digital techniques

Podrobná bibliografie
Hlavní autor:	Hurst, Stanley L.
Médium:	Kniha
Jazyk:	English
Vydáno:	Herts, U.K. The Institution of Electrical Engineers c1998.
Témata:	Integrated circuits > Very large scale integration > Testing.
On-line přístup:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access