VLSI testing digital and mixed analogue/digital techniques

Bibliographic Details
Main Author:	Hurst, Stanley L.
Format:	Book
Language:	English
Published:	Herts, U.K. The Institution of Electrical Engineers c1998.
Subjects:	Integrated circuits > Very large scale integration > Testing.
Online Access:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access