Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. The Institution of Electrical Engineers.
芝加哥风格引文Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Herts, U.K: The Institution of Electrical Engineers, 1998.
MLA引文Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. The Institution of Electrical Engineers, 1998.
警告:这些引文格式不一定是100%准确.