Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. The Institution of Electrical Engineers.
Cita Chicago Style (17a ed.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Herts, U.K: The Institution of Electrical Engineers, 1998.
Cita MLA (9a ed.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. The Institution of Electrical Engineers, 1998.
Precaución: Estas citas no son 100% exactas.