Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. The Institution of Electrical Engineers.
Dyfyniad Arddull ChicagoHurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Herts, U.K: The Institution of Electrical Engineers, 1998.
Dyfyniad MLAHurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. The Institution of Electrical Engineers, 1998.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.