Cita APA

Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. The Institution of Electrical Engineers. https://doi.org/10.1049/PBCS009E

Citación estilo Chicago

Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Herts, U.K: The Institution of Electrical Engineers, 1998. https://doi.org/10.1049/PBCS009E.

Cita MLA

Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. The Institution of Electrical Engineers, 1998. https://doi.org/10.1049/PBCS009E.