Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Podrobná bibliografie
Korporace:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Další autoři:	Mueller, William M., ed, Fay, Marie, ed
Médium:	Kniha
Jazyk:	English
Vydáno:	Denver 1957- .
Vydání:	6th ed.
Témata:	X-rays > Industrial applications > Congresses.