Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Dades bibliogràfiques
Autor corporatiu:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Altres autors:	Mueller, William M., ed, Fay, Marie, ed
Format:	Llibre
Idioma:	English
Publicat:	Denver 1957- .
Edició:	6th ed.
Matèries:	X-rays > Industrial applications > Congresses.